Parallel X-Fault Simulation with Critical Path Tracing
نویسندگان
چکیده
In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults. Keywords-digital circuits; fault simulation; X-fault model; parallel exact critical path fault tracing
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